Quantitative analysis of major and minor elemental concentrations (Mg to Ba) in sediments (using X-ray Fluorescence)
Benchtop Energy-Dispersive X-ray Fluorescence (ED-XRF) spectrometer
Instrument description
The benchtop PANalytical Epsilon 3XLE ED-XRF spectrometer (bought in 2018) provides quantitative measurements of the chemical composition of ground samples of marine and continental sediments. Thus, it gives access to the concentrations of 19 major and minor elements (Mg to Ba) of sediment samples, in a rapid, non-destructive and cheap manner, and with a limited preparation of sediment samples. The measurement of one sample takes about 10 minutes.
Principle of analysis
Elemental concentrations are measured by X-ray Fluorescence directly at the surface of ground sediment samples (protected by a thin transparent foil). Primary X-radiation emitted by a tube of varying intensity and voltage induces the ionisation of atoms of the sediment and the reorganisation of electrons between inner and outer shells of atoms. This results in the emission of fluorescent X-radiation, whose energy is characteristic of a particular atom. The energy-dispersive detector measures the energy distribution of the fluorescent X-radiation, from which the number of counts is deduced for each element. The calibration established using 39 certified sediment standards of various compositions converts, for each element, the number of counts into concentrations (in ppm).
Analyses performed with the instrument
Concentrations of 19 major and minor elements (Al, As, Ca, Ba, Co, Cr, Cu, Fe, K, Mg, Mn, Ni, Pb, Rb, Si, Sr, Ti, Zn, Zr) measured at the surface of dry and ground sediment samples.
Contacts
Aline Govin: This email address is being protected from spambots. You need JavaScript enabled to view it.
Aurélie Van Toer: This email address is being protected from spambots. You need JavaScript enabled to view it.
Semi-quantitative analyses of major and minor elemental contents (Mg to Ba) in sediments (using X-ray Fluorescence)
X-ray Fluorescence (XRF) core scanner
Instrument description
The 4th generation Avaatech XRF core scanner (bought in 2019) provides high-resolution (down to 100 µm) measurements of the chemical composition of marine and continental sediments. This semi-quantitative analysis gives access to the contents of major and minor elements (Mg to Ba), in an ultra-rapid and non-destructive manner, and with a very limited preparation of sediment cores. The measurement of one meter of sediment core (at 10, 30 and 50 kV) with a 1-cm step size takes about 2.5 hours.
Principle of analysis
Elemental contents are measured by X-ray Fluorescence directly at the sediment surface of split cores, which has been previously smoothed and covered with a thin transparent foil. Primary X-radiation emitted by a tube of varying intensity and voltage induces the ionisation of atoms of the sediment and the reorganisation of electrons between inner and outer shells of atoms. This results in the emission of fluorescent X-radiation, whose energy is characteristic of a particular atom. The energy-dispersive detector measures the energy distribution of the fluorescent X-radiation, from which the bAxil® software deduces the number of counts for each element.
Analyses performed with the instrument
Contents of major and minor elements (Mg to Ba) measured at the sediment surface of split cores.
Contacts
Aline Govin : This email address is being protected from spambots. You need JavaScript enabled to view it.
Camille Wandres : This email address is being protected from spambots. You need JavaScript enabled to view it.