Benchtop Energy-Dispersive X-ray Fluorescence (ED-XRF) spectrometer
Instrument description
The benchtop PANalytical Epsilon 3XLE ED-XRF spectrometer (bought in 2018) provides quantitative measurements of the chemical composition of ground samples of marine and continental sediments. Thus, it gives access to the concentrations of 19 major and minor elements (Mg to Ba) of sediment samples, in a rapid, non-destructive and cheap manner, and with a limited preparation of sediment samples. The measurement of one sample takes about 10 minutes.
Principle of analysis
Elemental concentrations are measured by X-ray Fluorescence directly at the surface of ground sediment samples (protected by a thin transparent foil). Primary X-radiation emitted by a tube of varying intensity and voltage induces the ionisation of atoms of the sediment and the reorganisation of electrons between inner and outer shells of atoms. This results in the emission of fluorescent X-radiation, whose energy is characteristic of a particular atom. The energy-dispersive detector measures the energy distribution of the fluorescent X-radiation, from which the number of counts is deduced for each element. The calibration established using 39 certified sediment standards of various compositions converts, for each element, the number of counts into concentrations (in ppm).
Analyses performed with the instrument
Concentrations of 19 major and minor elements (Al, As, Ca, Ba, Co, Cr, Cu, Fe, K, Mg, Mn, Ni, Pb, Rb, Si, Sr, Ti, Zn, Zr) measured at the surface of dry and ground sediment samples.
Contacts
Aline Govin: This email address is being protected from spambots. You need JavaScript enabled to view it.
Aurélie Van Toer: This email address is being protected from spambots. You need JavaScript enabled to view it.